Author: Czwalinna, M.K.
Paper Title Page
TUP012 First Measurements of an Electro-Optical Bunch Arrival-Time Monitor Prototype with PCB-Based Pickups for ELBE 214
 
  • B.E.J. Scheible, A. Penirschke
    THM, Friedberg, Germany
  • W. Ackermann, H. De Gersem
    TEMF, TU Darmstadt, Darmstadt, Germany
  • M.K. Czwalinna, T.A. Nazer, H. Schlarb, S. Vilcins
    DESY, Hamburg, Germany
  • M. Freitag, M. Kuntzsch
    HZDR, Dresden, Germany
 
  Funding: This work is supported by the German Federal Ministry of Education and Research (BMBF) under Contract No. 05K19RO1 and 05K22RO2.
A vac­uum sealed pro­to­type of an elec­tro-op­ti­cal bunch-ar­rival-time mon­i­tor has been com­mis­sioned in 2023. It com­prises of a pickup-struc­ture and a low-pi-volt­age ul­tra-wide­band trav­el­ing wave elec­tro-op­ti­cal mod­u­la­tor. The stain­less-steel body of the pickup struc­ture is par­tially pro­duced by ad­di­tive man­u­fac­tur­ing and com­prises four pick­ups as well as an in­te­grated com­bi­na­tion net­work on a printed cir­cuit board. This novel de­sign aims to en­able sin­gle-shot bunch-ar­rival-time mea­sure­ments for elec­tron beams in free-elec­tron lasers with sin­gle-digit fs pre­ci­sion for low bunch charges down to 1 pC. The the­o­ret­i­cal jit­ter charge prod­uct has been es­ti­mated by sim­u­la­tion and mod­el­ing to be in the order of 9 fs pC. The new pro­to­type is tai­lored for val­i­da­tion ex­per­i­ments at the ELBE ac­cel­er­a­tor beam­line. In this con­tri­bu­tion first mea­sure­ment re­sults are pre­sented.
 
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DOI • reference for this paper ※ doi:10.18429/JACoW-IBIC2023-TUP012  
About • Received ※ 06 September 2023 — Revised ※ 08 September 2023 — Accepted ※ 13 September 2023 — Issue date ※ 17 September 2023
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TUP013
Diversity Enhanced Electro-Optic Sampling at EuXFEL  
 
  • B. Steffen, M.K. Czwalinna
    DESY, Hamburg, Germany
  • S. Bielawski, Q. Demazeux, C. Evain, E. Roussel, C. Szwaj
    PhLAM/CERLA, Villeneuve d’Ascq, France
 
  Elec­tro-op­ti­cal de­tec­tion has proven to be a valu­able tech­nique to study tem­po­ral pro­files of THz pulses with pulse du­ra­tions down to fem­tosec­onds. Re­cently, a nu­mer­i­cal re­con­struc­tion strat­egy called DEOS [1] (Di­ver­sity Elec­tro-Op­ti­cal Sam­pling) proved to be much more ef­fi­cient in re­triev­ing ul­tra­fast input sig­nals. First tests at the Eu­ro­pean X-ray FEL (Eu­XFEL) in Ham­burg show a 200 fs tem­po­ral res­o­lu­tion over more than 10 ps record­ing length. This tech­nique, how­ever, re­quires to mea­sure both or­thog­o­nal po­lar­iza­tions of the sam­pling laser pulse si­mul­ta­ne­ously. Fur­ther adap­ta­tions to the ex­ist­ing de­sign of the com­pact EOD bunch length mon­i­tor [2] are needed to fully im­ple­ment the new mea­sure­ment strat­egy, which will be pre­sented in this paper.
[1] E. Roussel, C. Szwaj, C. Evain, B. Steffen, C. Gerth, B. Jalali and S. Bielawski, Light Sci. Appl., vol. 11, p. 14, 2022. doi:10.1038/s41377-021-00696-2 [2] B. Steffen, Ch. Gerth, M. Caselle, M. Felber, T. Kozak, D. R. Makowski, U. Mavric, A. Mielczarek, P. Peier, K. Przygoda, and L. Rota, Sci. Instrum., vol 91, p. 045123, 2020. doi:10.1063/1.5142833
 
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