Author: Chung, M.
Paper Title Page
WE3C02 Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing 318
 
  • B.K. Shin, G. Hahn
    PAL, Pohang, Republic of Korea
  • M. Chung, C.K. Sung
    UNIST, Ulsan, Republic of Korea
 
  We have de­vel­oped a highly pre­cise 4D emit­tance meter for X-Y cou­pled beams with 4D phase-space (x-x’, y-y’, x-y’, y-x’) which uti­lizes an L-shaped slit and em­ploys novel analy­sis tech­niques. Our ap­proach in­volves two types of slit-screen image pro­cess­ing to gen­er­ate pep­per-pot-like im­ages with great ac­cu­racy. One which we call the "dif­fer­en­tial slit" method, was de­vel­oped by our group. This ap­proach in­volves com­bin­ing two slit-screen im­ages, one at po­si­tion x and the other at po­si­tion x + the size of the slit, to cre­ate a dif­fer­en­tial slit image. The other method we use is the "vir­tual pep­per-pot (VPP)" method, which com­bines x-slit and y-slit im­ages to pro­duce a hole (x,y) image. By com­bin­ing that hole im­ages, we are able to take extra x-y’ and y-x’ phase-space. The "dif­fer­en­tial slit" method is cru­cial for ac­cu­rately mea­sur­ing emit­tance. Through sim­u­la­tions with 0.1 mm slit width using Geant4, the emit­tance un­cer­tain­ties for a 5 nm rad and 0.2 mm size elec­tron beam were 5% and 250% with and with­out the "dif­fer­en­tial slit", re­spec­tively. In this pre­sen­ta­tion, we pro­vide a de­scrip­tion of the method­ol­ogy, the de­sign of slit, and the re­sults of the 4D emit­tance mea­sure­ments.  
slides icon Slides WE3C02 [4.459 MB]  
DOI • reference for this paper ※ doi:10.18429/JACoW-IBIC2023-WE3C02  
About • Received ※ 30 August 2023 — Revised ※ 13 September 2023 — Accepted ※ 26 September 2023 — Issue date ※ 28 September 2023
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