<?xml version="1.0" encoding="UTF-8"?>
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  <records>
    <record>
       <contributors>
          <authors>
             <author>Lokey, A.</author>
             <author>Lidia, S.M.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Status of Gas Sheet Monitor for Profile Measurements at FRIB
          </title>
       </titles>
       <publisher>JACoW Publishing</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>2673-5350</isbn>
		 <isbn>978-3-95450-236-3</isbn>
		 <electronic-resource-num>10.18429/JACoW-IBIC2023-WEP027</electronic-resource-num>
		 <language>English</language>
		 <pages>410-412</pages>
       <keywords>
          <keyword>photon</keyword>
          <keyword>simulation</keyword>
          <keyword>optics</keyword>
          <keyword>heavy-ion</keyword>
          <keyword>vacuum</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2023</year>
          <pub-dates>
             <date>2023-12</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-IBIC2023-WEP027</url>
              <url>https://jacow.org/ibic2023/papers/wep027.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          We report on the status of work on a non-invasive profile monitor under development for use at the Facility for Rare Isotope Beams (FRIB), a heavy-ion LINAC which produces high-intensity, multi-charge state beams. The measurement will be made by collecting photons generated at the interaction point of the beam and a collimated molecular gas curtain. These photons will be collected with an intensified camera system, generating a two dimensional image and allowing for measurements of profile, beam halo, and other properties more prevalent at specific locations of interest, such as charge state spread after folding segment bends. Included will be ongoing design specifications, simulation results, and discussion of measurement techniques for acquiring signal from the device.
       </abstract>
    </record>
  </records>
</xml>
