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@inproceedings{shin:ibic2023-we3c02, author = {B.K. Shin and M. Chung and G. Hahn and C.K. Sung}, title = {{Development of a Precise 4d Emittance Meter Using Differential Slit Image Processing}}, % booktitle = {Proc. IBIC'23}, booktitle = {Proc. 12th Int. Beam Instrum. Conf. (IBIC'23)}, eventdate = {2023-09-10/2023-09-14}, pages = {318--320}, paper = {WE3C02}, language = {english}, keywords = {emittance, simulation, experiment, electron, background}, venue = {Saskatoon, Canada}, series = {International Beam Instrumentation Conference}, number = {12}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2673-5350}, isbn = {978-3-95450-236-3}, doi = {10.18429/JACoW-IBIC2023-WE3C02}, url = {https://jacow.org/ibic2023/papers/we3c02.pdf}, abstract = {{We have developed a highly precise 4D emittance meter for X-Y coupled beams with 4D phase-space (x-x’, y-y’, x-y’, y-x’) which utilizes an L-shaped slit and employs novel analysis techniques. Our approach involves two types of slit-screen image processing to generate pepper-pot-like images with great accuracy. One which we call the "differential slit" method, was developed by our group. This approach involves combining two slit-screen images, one at position x and the other at position x + the size of the slit, to create a differential slit image. The other method we use is the "virtual pepper-pot (VPP)" method, which combines x-slit and y-slit images to produce a hole (x,y) image. By combining that hole images, we are able to take extra x-y’ and y-x’ phase-space. The "differential slit" method is crucial for accurately measuring emittance. Through simulations with 0.1 mm slit width using Geant4, the emittance uncertainties for a 5 nm rad and 0.2 mm size electron beam were 5% and 250% with and without the "differential slit", respectively. In this presentation, we provide a description of the methodology, the design of slit, and the results of the 4D emittance measurements.}}, }